Aluminum nitride integration on silicon nitride photonic circuits: A hybrid approach towards on-chip nonlinear optics

Giulio Terrasanta, Timo Sommer, Manuel Müller, Matthias Althammer, Rudolf Gross, Menno Poot

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Aluminum nitride (AlN) is an emerging material for integrated quantum photonics due to its large χ(2) nonlinearity. Here we demonstrate the hybrid integration of AlN on silicon nitride (SiN) photonic chips. Composite microrings are fabricated by reactive DC sputtering of caxis oriented AlN on top of pre-patterned SiN. This new approach does not require any patterning of AlN and depends only on reliable SiN nanofabrication. This simplifies the nanofabrication process drastically. Optical characteristics, such as the quality factor, propagation losses and group index, are obtained. Our hybrid resonators can have a one order of magnitude increase in quality factor after the AlN integration, with propagation losses down to 0.7 dB/cm. Using finite-element simulations, phase matching in these waveguides is explored.

Original languageEnglish
Pages (from-to)8537-8549
Number of pages13
JournalOptics Express
Volume30
Issue number6
DOIs
StatePublished - 14 Mar 2022

Fingerprint

Dive into the research topics of 'Aluminum nitride integration on silicon nitride photonic circuits: A hybrid approach towards on-chip nonlinear optics'. Together they form a unique fingerprint.

Cite this