Aging mitigation of power supply-connected batteries

Jaemin Kim, Alma Probstl, Samarjit Chakraborty, Naehyuck Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Battery-operated portable electronics, from smartphones to notebook computers, are generally sold with a dedicated power supply. The power supply operates the device and also charges the built-in battery. Most users are concerned about the battery aging while the device is operated by the built-in battery. This is the first paper to our knowledge that discovers, analyzes and mitigates the built-in battery aging when the device is operated with the provided power supply. We focus on the fact that in an effort to reduce size and weight, the capacity of the power supply is optimized for the average power demand rather than the maximum power demand. Such a reduced-capacity power supply brings advantages in terms of size, weight and cost but it accelerates the battery aging because the aging progresses even when the device is operated by the power supply, which is different from the expectation of most users. We quantitatively analyze such battery aging with various operating scenarios based on standard benchmark programs. We show that the battery experiences significant aging, i.e., the battery lifetime can be reduced to 23% of its shelf lifetime. Finally, we propose a cost-effective supercapacior hybrid to mitigate such battery aging when the device is operated using the power supply. The simulation results show that 10, 1 and 0.1 mF supercapacitors can reduce the battery aging by 68.6%, 55.1% and 4.6%, respectively.

Original languageEnglish
Title of host publicationProceedings of the 2014 ACM/IEEE International Symposium on Low Power Electronics and Design, ISLPED 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages233-238
Number of pages6
ISBN (Electronic)9781450329750
DOIs
StatePublished - 13 Oct 2015
EventACM/IEEE International Symposium on Low Power Electronics and Design, ISLPED 2014 - La Jolla, United States
Duration: 11 Aug 201413 Aug 2014

Publication series

NameProceedings of the International Symposium on Low Power Electronics and Design
Volume2015-October
ISSN (Print)1533-4678

Conference

ConferenceACM/IEEE International Symposium on Low Power Electronics and Design, ISLPED 2014
Country/TerritoryUnited States
CityLa Jolla
Period11/08/1413/08/14

Keywords

  • Aging
  • Batteries
  • Benchmark testing
  • Degradation
  • Power supplies
  • Supercapacitors
  • System-on-chip

Fingerprint

Dive into the research topics of 'Aging mitigation of power supply-connected batteries'. Together they form a unique fingerprint.

Cite this