TY - GEN
T1 - Aging-constrained performance optimization for multi cores
AU - Khdr, Heba
AU - Amrouch, Hussam
AU - Henkel, Jörg
N1 - Publisher Copyright:
© 2018 Association for Computing Machinery.
PY - 2018/6/24
Y1 - 2018/6/24
N2 - Circuit aging has become a dire design concern and hence it is considered a primary design constraint. Current practice to cope with this problem is to apply (too) conservative means. In contrast, we introduce a far less restrictive approach by efficiently exploring a fundamentally new aging-aware design space comprising temperature (T ), aging degradation (ÄVth) and supply voltage (Vdd ). On that basis, we present a tailored multi core resource management (with # threads and v/f levels as parameters etc.) that aims to maximize performance (optimization goal) under aging constraint(s). We demonstrate that our approach is the first to fully exploit the performance/aging trade-off within this new design space but without the restrictions inherent to current state of the art. As a result, we achieve 43% increase in performance while maintaining the same level of circuit aging when compared to the best technique reported yet.
AB - Circuit aging has become a dire design concern and hence it is considered a primary design constraint. Current practice to cope with this problem is to apply (too) conservative means. In contrast, we introduce a far less restrictive approach by efficiently exploring a fundamentally new aging-aware design space comprising temperature (T ), aging degradation (ÄVth) and supply voltage (Vdd ). On that basis, we present a tailored multi core resource management (with # threads and v/f levels as parameters etc.) that aims to maximize performance (optimization goal) under aging constraint(s). We demonstrate that our approach is the first to fully exploit the performance/aging trade-off within this new design space but without the restrictions inherent to current state of the art. As a result, we achieve 43% increase in performance while maintaining the same level of circuit aging when compared to the best technique reported yet.
UR - http://www.scopus.com/inward/record.url?scp=85053702247&partnerID=8YFLogxK
U2 - 10.1145/3195970.3195985
DO - 10.1145/3195970.3195985
M3 - Conference contribution
AN - SCOPUS:85053702247
SN - 9781450357005
T3 - Proceedings - Design Automation Conference
BT - Proceedings of the 55th Annual Design Automation Conference, DAC 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 55th Annual Design Automation Conference, DAC 2018
Y2 - 24 June 2018 through 29 June 2018
ER -