TY - GEN
T1 - Aging analysis at gate and macro cell level
AU - Lorenz, Dominik
AU - Barke, Martin
AU - Schlichtmann, Ulf
PY - 2010
Y1 - 2010
N2 - Aging, which can be regarded as a timedependent variability, has until recently not received much attention in the field of electronic design automation. This is changing because increasing reliability costs threaten the continued scaling of ICs. We investigate the impact of aging effects on single combinatorial gates and present methods that help to reduce the reliability costs by accurately analyzing the performance degradation of aged circuits at gate and macro cell level.
AB - Aging, which can be regarded as a timedependent variability, has until recently not received much attention in the field of electronic design automation. This is changing because increasing reliability costs threaten the continued scaling of ICs. We investigate the impact of aging effects on single combinatorial gates and present methods that help to reduce the reliability costs by accurately analyzing the performance degradation of aged circuits at gate and macro cell level.
UR - https://www.scopus.com/pages/publications/78650924021
U2 - 10.1109/ICCAD.2010.5654309
DO - 10.1109/ICCAD.2010.5654309
M3 - Conference contribution
AN - SCOPUS:78650924021
SN - 9781424481927
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 77
EP - 84
BT - 2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
Y2 - 7 November 2010 through 11 November 2010
ER -