Ag + Au bilayers on Si(111) studied with scanning photoemission microscopy

M. Marsi, S. Günther, A. Kolmakov, J. Kovac, L. Casalis, L. Gregoratti, D. Lonza, M. Kiskinova

Research output: Contribution to journalArticlepeer-review

Abstract

We used a scanning photoemission microscope to study with submicron spatial resolution the different phases present at (Ag + Au)/Si interfaces. By changing Ag and Au deposition sequence, coverages and annealing temperature, we were able to identify the driving mechanisms of the evolution of this model bimetal/semiconductor junction.

Original languageEnglish
Pages (from-to)991-995
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume88-91
DOIs
StatePublished - Mar 1998
Externally publishedYes

Keywords

  • Metal-semiconductor interfaces
  • Scanning photoemission microscopy
  • Silicides
  • Synchrotron radiation spectromicroscopy

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