Advances in nanoimprint lithography

Paolo Lugli, Stefan Harrer, Sebastian Strobel, Francesca Brunetti, Giuseppe Scarpa, Marc Tornow, Gerhard Abstreiter

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

Challenges and issues of Nanoimprint Lithography (NIL) are addressed and discussed. In particular, imprinting properties of an innovative epoxy-based polymer have been investigated, which can be used for combined thermal and ultraviolet nanoimprinting (TUV-NIL) processes aiming at high-throughput nanoimprint lithography. Our recent progress in developing a new room-temperature nanoimprint (RTNIL) tool for the sub-10-nm region is shown.

Original languageEnglish
Title of host publication2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings
Pages1179-1184
Number of pages6
DOIs
StatePublished - 2007
Event2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007 - Hong Kong, China
Duration: 2 Aug 20075 Aug 2007

Publication series

Name2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings

Conference

Conference2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007
Country/TerritoryChina
CityHong Kong
Period2/08/075/08/07

Keywords

  • Isothermal imprint
  • Nanofabrication
  • Nanoimprint lithography
  • Room-temperature nanoimprint lithography

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