Activation spectroscopy of solid Ne

I. V. Khyzhniy; O. N. Grigorashchenko; A. N. Ogurtsov; E. V. Savchenko; M. Frankowski; A. M. Smith-Gicklhorn; V. E. Bondybey

doi:10.1117/12.569826

Activation spectroscopy of solid Ne

I. V. Khyzhniy
, O. N. Grigorashchenko
, A. N. Ogurtsov
, E. V. Savchenko
, M. Frankowski
, A. M. Smith-Gicklhorn
, V. E. Bondybey

Chair of Physical Chemistry

B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine
V. N. Karazin Kharkiv National University
Technical University of Munich
Polish Academy of Sciences

Research output: Contribution to journal › Conference article › peer-review

Abstract

Radiation-induced defects formed via electronic subsystem in solid Ne were studied combining thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) techniques. In the present paper the TSL and TSEE measurements of solid Ne were performed for the first time. The whole set of obtained experimental data suggests that in solid Ne at the temperature 10.5 K the annihilation of electronically induced defects occurs. Comparing experimental data with theoretical calculation the atomic configuration of radiation-induced defects was elucidated.

Original language	English
Pages (from-to)	235-241
Number of pages	7
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5507
DOIs	https://doi.org/10.1117/12.569826
State	Published - 2004
Event	XVI International Conference on Spectroscopy of Molecules and Crystals - Sevastopol, Ukraine Duration: 25 May 2003 → 1 Jun 2003

Keywords

Activation spectroscopy
Exciton self-trapping
Radiation-induced defects
Rare gas solids

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10.1117/12.569826

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title = "Activation spectroscopy of solid Ne",

abstract = "Radiation-induced defects formed via electronic subsystem in solid Ne were studied combining thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) techniques. In the present paper the TSL and TSEE measurements of solid Ne were performed for the first time. The whole set of obtained experimental data suggests that in solid Ne at the temperature 10.5 K the annihilation of electronically induced defects occurs. Comparing experimental data with theoretical calculation the atomic configuration of radiation-induced defects was elucidated.",

keywords = "Activation spectroscopy, Exciton self-trapping, Radiation-induced defects, Rare gas solids",

author = "Khyzhniy, \{I. V.\} and Grigorashchenko, \{O. N.\} and Ogurtsov, \{A. N.\} and Savchenko, \{E. V.\} and M. Frankowski and Smith-Gicklhorn, \{A. M.\} and Bondybey, \{V. E.\}",

year = "2004",

doi = "10.1117/12.569826",

language = "English",

volume = "5507",

pages = "235--241",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "XVI International Conference on Spectroscopy of Molecules and Crystals ; Conference date: 25-05-2003 Through 01-06-2003",

}

TY - JOUR

T1 - Activation spectroscopy of solid Ne

AU - Khyzhniy, I. V.

AU - Grigorashchenko, O. N.

AU - Ogurtsov, A. N.

AU - Savchenko, E. V.

AU - Frankowski, M.

AU - Smith-Gicklhorn, A. M.

AU - Bondybey, V. E.

PY - 2004

Y1 - 2004

N2 - Radiation-induced defects formed via electronic subsystem in solid Ne were studied combining thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) techniques. In the present paper the TSL and TSEE measurements of solid Ne were performed for the first time. The whole set of obtained experimental data suggests that in solid Ne at the temperature 10.5 K the annihilation of electronically induced defects occurs. Comparing experimental data with theoretical calculation the atomic configuration of radiation-induced defects was elucidated.

AB - Radiation-induced defects formed via electronic subsystem in solid Ne were studied combining thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) techniques. In the present paper the TSL and TSEE measurements of solid Ne were performed for the first time. The whole set of obtained experimental data suggests that in solid Ne at the temperature 10.5 K the annihilation of electronically induced defects occurs. Comparing experimental data with theoretical calculation the atomic configuration of radiation-induced defects was elucidated.

KW - Activation spectroscopy

KW - Exciton self-trapping

KW - Radiation-induced defects

KW - Rare gas solids

UR - https://www.scopus.com/pages/publications/8844237697

U2 - 10.1117/12.569826

DO - 10.1117/12.569826

M3 - Conference article

AN - SCOPUS:8844237697

SN - 0277-786X

VL - 5507

SP - 235

EP - 241

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - XVI International Conference on Spectroscopy of Molecules and Crystals

Y2 - 25 May 2003 through 1 June 2003

ER -

Activation spectroscopy of solid Ne

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Keywords

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