@inproceedings{916bd45d5d384e9e807f6c58ce33ebd6,
title = "Accurate Power Loss Measurements of Aperture Tuning RF Switches on Board",
abstract = "In this work a measurement and de-embedding procedure for accurate characterization of power losses of a shunt antenna tuning switch mounted on board is presented. The method is based on the OPEN de-embedding technique, wherein the OPEN standard is custom-generated for every instance of the board with the switch. The method has been tested on a 4-throw hardware shunt switch with state-of-art performance. The experiment demonstrated the effectiveness of the method for obtaining accurate and repeatable response in terms of equivalent OFF resistance in the frequency range between 0.5GHz and 6GHz, significantly overperforming the conventional common de-embedding approach sensitive to assembly uncertainties of the board.",
keywords = "Antenna tuning, Aperture tuning, CMOS switch, De-embedding, High-voltage RF switch, Inverted-F antenna, RF front-end",
author = "Valentyn Solomko and Oguzhan Oezdamar and Johannes Rimmelspacher and Pablo Nascimento and Michael Muerke and Pyo, {Chul Seung} and Robert Weigel and Amelie Hagelauer",
note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 2021 IEEE Asia-Pacific Microwave Conference, APMC 2021 ; Conference date: 28-11-2021 Through 01-12-2021",
year = "2021",
doi = "10.1109/APMC52720.2021.9661640",
language = "English",
series = "Asia-Pacific Microwave Conference Proceedings, APMC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "91--93",
booktitle = "2021 IEEE Asia-Pacific Microwave Conference, APMC 2021",
}