Abstract
Fast light-induced degradation of amorphous silicon p-i-n solar cells has been investigated by replacing cw illumination by light pulses of the same average intensity. This method allows us to evaluate the long-term device performance with exposure times of the order of minutes and avoids complication due to cell temperature increase.
Original language | English |
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Pages (from-to) | 1709-1711 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 60 |
Issue number | 14 |
DOIs | |
State | Published - 1992 |
Externally published | Yes |