TY - GEN
T1 - A variation-aware adaptive voltage scaling technique based on in-situ delay monitoring
AU - Wirnshofer, Martin
AU - Heiß, Leonhard
AU - Georgakos, Georg
AU - Schmitt-Landsiedel, Doris
PY - 2011
Y1 - 2011
N2 - In this paper, we present an adaptive voltage scaling (AVS) scheme to tune the supply voltage of digital circuits according to variations. Compared to worst-case designs, which produce fixed and excessively large safety margins, a considerable amount of energy can be saved by this approach. The AVS technique is based on in-situ delay monitoring, i.e. observing the timing in critical paths. For this task, we propose a Pre-Error flip-flop, that is capable of detecting late data transitions - so-called pre-errors. We provide an in-depth analysis, that is based on a Markov model, to describe the closed loop voltage regulation. We simulated the power saving potential compared to the worst-case design and obtained a reduction of 13.5% in active energy for a negligible error rate of 1E-15. Moreover, we illustrate the opportunity to further reduce the power consumption when tolerating higher error rates. This way, our approach can gain the optimal power saving for a given allowed failure probability.
AB - In this paper, we present an adaptive voltage scaling (AVS) scheme to tune the supply voltage of digital circuits according to variations. Compared to worst-case designs, which produce fixed and excessively large safety margins, a considerable amount of energy can be saved by this approach. The AVS technique is based on in-situ delay monitoring, i.e. observing the timing in critical paths. For this task, we propose a Pre-Error flip-flop, that is capable of detecting late data transitions - so-called pre-errors. We provide an in-depth analysis, that is based on a Markov model, to describe the closed loop voltage regulation. We simulated the power saving potential compared to the worst-case design and obtained a reduction of 13.5% in active energy for a negligible error rate of 1E-15. Moreover, we illustrate the opportunity to further reduce the power consumption when tolerating higher error rates. This way, our approach can gain the optimal power saving for a given allowed failure probability.
UR - http://www.scopus.com/inward/record.url?scp=79959977723&partnerID=8YFLogxK
U2 - 10.1109/DDECS.2011.5783090
DO - 10.1109/DDECS.2011.5783090
M3 - Conference contribution
AN - SCOPUS:79959977723
SN - 9781424497560
T3 - Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011
SP - 261
EP - 266
BT - Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011
T2 - 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011
Y2 - 13 April 2011 through 15 April 2011
ER -