TY - JOUR
T1 - A Two-Dimensional 'Zigzag' Silica Polymorph on a Metal Support
AU - Kuhness, David
AU - Yang, Hyun Jin
AU - Klemm, Hagen W.
AU - Prieto, Mauricio
AU - Peschel, Gina
AU - Fuhrich, Alexander
AU - Menzel, Dietrich
AU - Schmidt, Thomas
AU - Yu, Xin
AU - Shaikhutdinov, Shamil
AU - Lewandowski, Adrian
AU - Heyde, Markus
AU - Kelemen, Anna
AU - Włodarczyk, Radosław
AU - Usvyat, Denis
AU - Schütz, Martin
AU - Sauer, Joachim
AU - Freund, Hans Joachim
N1 - Publisher Copyright:
© 2018 American Chemical Society.
PY - 2018/5/16
Y1 - 2018/5/16
N2 - We present a new polymorph of the two-dimensional (2D) silica film with a characteristic 'zigzag' line structure and a rectangular unit cell which forms on a Ru(0001) metal substrate. This new silica polymorph may allow for important insights into growth modes and transformations of 2D silica films as a model system for the study of glass transitions. Based on scanning tunneling microscopy, low energy electron diffraction, infrared reflection absorption spectroscopy, and X-ray photoelectron spectroscopy measurements on the one hand, and density functional theory calculations on the other, a structural model for the 'zigzag' polymorph is proposed. In comparison to established monolayer and bilayer silica, this 'zigzag' structure system has intermediate characteristics in terms of coupling to the substrate and stoichiometry. The silica 'zigzag' phase is transformed upon reoxidation at higher annealing temperature into a SiO2 silica bilayer film which is chemically decoupled from the substrate.
AB - We present a new polymorph of the two-dimensional (2D) silica film with a characteristic 'zigzag' line structure and a rectangular unit cell which forms on a Ru(0001) metal substrate. This new silica polymorph may allow for important insights into growth modes and transformations of 2D silica films as a model system for the study of glass transitions. Based on scanning tunneling microscopy, low energy electron diffraction, infrared reflection absorption spectroscopy, and X-ray photoelectron spectroscopy measurements on the one hand, and density functional theory calculations on the other, a structural model for the 'zigzag' polymorph is proposed. In comparison to established monolayer and bilayer silica, this 'zigzag' structure system has intermediate characteristics in terms of coupling to the substrate and stoichiometry. The silica 'zigzag' phase is transformed upon reoxidation at higher annealing temperature into a SiO2 silica bilayer film which is chemically decoupled from the substrate.
UR - http://www.scopus.com/inward/record.url?scp=85046497531&partnerID=8YFLogxK
U2 - 10.1021/jacs.8b02905
DO - 10.1021/jacs.8b02905
M3 - Article
C2 - 29688718
AN - SCOPUS:85046497531
SN - 0002-7863
VL - 140
SP - 6164
EP - 6168
JO - Journal of the American Chemical Society
JF - Journal of the American Chemical Society
IS - 19
ER -