TY - GEN
T1 - A trade-off between nominal forward current density and surge current capability for 4.5kV SiC MPS diodes
AU - Huang, Yaren
AU - Erlbacher, Tobias
AU - Buettner, Jonas
AU - Wachutka, Gerhard
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/7/25
Y1 - 2016/7/25
N2 - There is a trade-off between nominal forward current density and surge current capability for 4.5kV SiC MPS diodes. This paper explains the physical mechanisms underlying this trade-off and identifies the relevant design parameters. The dependencies of this trade-off on the layout parameters and physical parameters are described by analytical relations (compact model). An equivalent lumped element circuit is set up for an intuitive interpretation of the functional components of a SiC MPS diode. Eventually, we investigate several novel device structures with a view to improving the forward characteristics under regular and overcurrent operating conditions.
AB - There is a trade-off between nominal forward current density and surge current capability for 4.5kV SiC MPS diodes. This paper explains the physical mechanisms underlying this trade-off and identifies the relevant design parameters. The dependencies of this trade-off on the layout parameters and physical parameters are described by analytical relations (compact model). An equivalent lumped element circuit is set up for an intuitive interpretation of the functional components of a SiC MPS diode. Eventually, we investigate several novel device structures with a view to improving the forward characteristics under regular and overcurrent operating conditions.
UR - http://www.scopus.com/inward/record.url?scp=84982170387&partnerID=8YFLogxK
U2 - 10.1109/ISPSD.2016.7520778
DO - 10.1109/ISPSD.2016.7520778
M3 - Conference contribution
AN - SCOPUS:84982170387
T3 - Proceedings of the International Symposium on Power Semiconductor Devices and ICs
SP - 63
EP - 66
BT - Proceedings of the 2016 28th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 28th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2016
Y2 - 12 June 2016 through 16 June 2016
ER -