TY - GEN
T1 - A superresolution framework for high-accuracy multiview reconstruction
AU - Goldlücke, Bastian
AU - Cremers, Daniel
PY - 2009
Y1 - 2009
N2 - We present a variational approach to jointly estimate a displacement map and a superresolution texture for a 3D model from multiple calibrated views. The superresolution image formation model leads to an energy functional defined in terms of an integral over the object surface. This functional can be minimized by alternately solving a deblurring PDE and a total variation minimization on the surface, leading to increasingly accurate estimates of photometry and geometry, respectively. The resulting equations can be discretized and solved on texture space with the help of a conformal atlas. The superresolution approach to texture reconstruction allows to obtain fine details in the texture map which surpass individual input image resolution.
AB - We present a variational approach to jointly estimate a displacement map and a superresolution texture for a 3D model from multiple calibrated views. The superresolution image formation model leads to an energy functional defined in terms of an integral over the object surface. This functional can be minimized by alternately solving a deblurring PDE and a total variation minimization on the surface, leading to increasingly accurate estimates of photometry and geometry, respectively. The resulting equations can be discretized and solved on texture space with the help of a conformal atlas. The superresolution approach to texture reconstruction allows to obtain fine details in the texture map which surpass individual input image resolution.
UR - https://www.scopus.com/pages/publications/70350441883
U2 - 10.1007/978-3-642-03798-6_35
DO - 10.1007/978-3-642-03798-6_35
M3 - Conference contribution
AN - SCOPUS:70350441883
SN - 3642037976
SN - 9783642037979
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 342
EP - 351
BT - Pattern Recognition - 31st DAGM Symposium, Proceedings
T2 - 31st Annual Symposium of the Deutsche Arbeitsgemeinschaft fur Mustererkennung, DAGM 2009
Y2 - 9 September 2009 through 11 September 2009
ER -