A Scalable Design Flow for Performance Monitors Using Functional Path Ring Oscillators

Tobias Kilian, Heiko Ahrens, Daniel Tille, Martin Huch, Ulf Schlichtmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

The automotive industry sets high reliability standards for microcontroller (MCUs). To increase reliability, the automotive MCU manufacturers are looking for accurate performance screening. One of these performance screening mechanisms are functional path ring oscillators (RO). In this paper, a scalable and efficient method for creating functional path ring oscillators is presented. Implementation data demonstrate that functional path RO monitors show a significant advantage in area and power consumption over comparable performance screening methods.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE International Test Conference, ITC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages299-303
Number of pages5
ISBN (Electronic)9781665416955
DOIs
StatePublished - 2021
Externally publishedYes
Event2021 IEEE International Test Conference, ITC 2021 - Virtual, Online, United States
Duration: 10 Oct 202115 Oct 2021

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539

Conference

Conference2021 IEEE International Test Conference, ITC 2021
Country/TerritoryUnited States
CityVirtual, Online
Period10/10/2115/10/21

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