TY - GEN
T1 - A random and pseudo-gradient approach for analog circuit sizing with non-uniformly discretized parameters
AU - Pehl, Michael
AU - Massier, Tobias
AU - Graeb, Helmut
AU - Schlichtmann, Ulf
PY - 2008
Y1 - 2008
N2 - Many methods for analog circuit sizing are available as commercial, in-house and academic tools. They are based on continuous optimization, e.g., of transistor geometries, although the subsequent layout step requires values on a predefined grid. In addition, sizing of transistors for bipolar and RF circuits frequently necessitates the use of multiples of predefined values for the design parameters. This paper presents a novel method for solving this type of discrete optimization problem. An iterative approach is presented, which is based on pseudo-gradients and a randomized calculation of search regions and steps. Experimental comparisons with simulated annealing and a continuous sizing approach with subsequent discretization clearly show the effectivity and efficiency of the presented method.
AB - Many methods for analog circuit sizing are available as commercial, in-house and academic tools. They are based on continuous optimization, e.g., of transistor geometries, although the subsequent layout step requires values on a predefined grid. In addition, sizing of transistors for bipolar and RF circuits frequently necessitates the use of multiples of predefined values for the design parameters. This paper presents a novel method for solving this type of discrete optimization problem. An iterative approach is presented, which is based on pseudo-gradients and a randomized calculation of search regions and steps. Experimental comparisons with simulated annealing and a continuous sizing approach with subsequent discretization clearly show the effectivity and efficiency of the presented method.
UR - http://www.scopus.com/inward/record.url?scp=62349084915&partnerID=8YFLogxK
U2 - 10.1109/ICCD.2008.4751860
DO - 10.1109/ICCD.2008.4751860
M3 - Conference contribution
AN - SCOPUS:62349084915
SN - 9781424426584
T3 - 26th IEEE International Conference on Computer Design 2008, ICCD
SP - 188
EP - 193
BT - 26th IEEE International Conference on Computer Design 2008, ICCD
T2 - 26th IEEE International Conference on Computer Design 2008, ICCD
Y2 - 12 October 2008 through 15 October 2008
ER -