A novel preisach operator for modeling of hysteresis in VO2 microbolometer

L. A.L. De Almeida, G. S. Deep, A. M.N. Lima

Research output: Contribution to conferencePaperpeer-review

3 Scopus citations

Abstract

Modelling of vanadium dioxide (VO2) thin film microbolometer, based on the classical Preisach model, presents some discrepancies between simulation and experimentally obtained hysteresis data. This is due to the asymmetric feature of the resistance-temperature dependence in VO2 films. To reduce these discrepancies, especially for temperatures bellow 35C, we propose in this paper a novel operator for the classical Preisach model. This new operator accounts for reversible and irreversible components, similar to the behavior of a VO2 microcrystal. The model's parameters are obtained from experimentally measured characteristics, which are compared with simulated data from the model.

Original languageEnglish
Pages281-286
Number of pages6
StatePublished - 2002
Externally publishedYes
Event19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, AK, United States
Duration: 21 May 200223 May 2002

Conference

Conference19th IEEE Instrumentation and Measurement Technology Conference
Country/TerritoryUnited States
CityAnchorage, AK
Period21/05/0223/05/02

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