Abstract
Modelling of vanadium dioxide (VO2) thin film microbolometer, based on the classical Preisach model, presents some discrepancies between simulation and experimentally obtained hysteresis data. This is due to the asymmetric feature of the resistance-temperature dependence in VO2 films. To reduce these discrepancies, especially for temperatures bellow 35C, we propose in this paper a novel operator for the classical Preisach model. This new operator accounts for reversible and irreversible components, similar to the behavior of a VO2 microcrystal. The model's parameters are obtained from experimentally measured characteristics, which are compared with simulated data from the model.
Original language | English |
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Pages | 281-286 |
Number of pages | 6 |
State | Published - 2002 |
Externally published | Yes |
Event | 19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, AK, United States Duration: 21 May 2002 → 23 May 2002 |
Conference
Conference | 19th IEEE Instrumentation and Measurement Technology Conference |
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Country/Territory | United States |
City | Anchorage, AK |
Period | 21/05/02 → 23/05/02 |