A measurement system for capacitive PUF-based security enclosures

Johannes Obermaier, Vincent Immler, Matthias Hiller, Georg Sigl

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

13 Scopus citations

Abstract

Battery-backed security enclosures that are permanently monitored for penetration and tampering are common solutions for providing physical integrity to multi-chip embedded systems. This paper presents a well-tailored measurement system for a batteryless PUFbased capacitive enclosure. The key is derived from the PUF and encrypts the underlying system. We present a system concept for combined enclosure integrity verification and PUF evaluation. The system performs differential capacitive measurements inside the enclosure by applying stimulus signals with a 180. phase shift that isolate the local variation in the femtofarad range. The analog circuitry and corresponding digital signal processing chain perform precise PUF digitization, using a microcontroller-based digital lockin amplifier. The systemfs measurement range is approximately}73 fF, the conversion time per PUF node is less than 0.6 ms, and the raw data shows a measurement noise of 0.3 fF. This is the base for a high-entropy key generation while enabling a short system startup time. The system is scalable to the enclosure size and has been experimentally verified to extract information from 128 PUF nodes, using a system prototype. The results show that our concept forms a cornerstone of a novel batteryless PUF-based security enclosure.

Original languageEnglish
Title of host publicationProceedings of the 55th Annual Design Automation Conference, DAC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781450357005
DOIs
StatePublished - 24 Jun 2018
Event55th Annual Design Automation Conference, DAC 2018 - San Francisco, United States
Duration: 24 Jun 201829 Jun 2018

Publication series

NameProceedings - Design Automation Conference
VolumePart F137710
ISSN (Print)0738-100X

Conference

Conference55th Annual Design Automation Conference, DAC 2018
Country/TerritoryUnited States
CitySan Francisco
Period24/06/1829/06/18

Keywords

  • Capacitive Sensing
  • FIPS 140-2
  • HSM
  • PUF
  • Security Enclosure

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