@inproceedings{d8383bb0f0e74270a497ac95b71b194f,
title = "A low-power true random number generator using random telegraph noise of single oxide-traps",
abstract = "A true random number generator is realized by utilizing the noise produced by single oxide traps in small-area MOSFETs in combination with built-in redundancy. The circuit has an area of 0.009mm2 in 0.12μm CMOS and consumes 50μW at 200kb/s random output data. The concept is robust against environmental noise and supply-voltage variations and is thus suitable for operation within security controllers.",
author = "Ralf Brederlow and Ramesh Prakash and Christian Paulus and Roland Thewes",
year = "2006",
language = "English",
isbn = "1424400791",
series = "Digest of Technical Papers - IEEE International Solid-State Circuits Conference",
pages = "422+417",
booktitle = "2006 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers",
note = "2006 IEEE International Solid-State Circuits Conference, ISSCC ; Conference date: 06-02-2006 Through 09-02-2006",
}