A Geiger-mode avalanche photodiode array for X-ray photon correlation spectroscopy

I. Johnson; Z. Sadygov; O. Bunk; A. Menzel; F. Pfeiffer; D. Renker

doi:10.1107/S0909049508034365

A Geiger-mode avalanche photodiode array for X-ray photon correlation spectroscopy

I. Johnson, Z. Sadygov, O. Bunk, A. Menzel, F. Pfeiffer, D. Renker

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

X-ray photon correlation spectroscopy (XPCS) provides an opportunity to study the dynamics of systems by measuring the temporal fluctuations in a far-field diffraction pattern. A two-dimensional detector system has been developed to investigate fluctuations in the frequency range of several Hz to kHz. The X-ray detector system consists of a thin 100 m scintillation crystal coupled to a Geiger-mode avalanche photodiode array. In this article the elements of the system are detailed and the detector for XPCS measurements is demonstrated.

Original language	English
Pages (from-to)	105-109
Number of pages	5
Journal	Journal of Synchrotron Radiation
Volume	16
Issue number	1
DOIs	https://doi.org/10.1107/S0909049508034365
State	Published - 2008
Externally published	Yes

Keywords

Detector
Dynamic light scattering
Geiger-mode avalanche photodiode
Photon correlation spectroscopy
X-ray diffraction
X-ray photon correlation spectroscopy

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10.1107/S0909049508034365

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abstract = "X-ray photon correlation spectroscopy (XPCS) provides an opportunity to study the dynamics of systems by measuring the temporal fluctuations in a far-field diffraction pattern. A two-dimensional detector system has been developed to investigate fluctuations in the frequency range of several Hz to kHz. The X-ray detector system consists of a thin 100 m scintillation crystal coupled to a Geiger-mode avalanche photodiode array. In this article the elements of the system are detailed and the detector for XPCS measurements is demonstrated.",

keywords = "Detector, Dynamic light scattering, Geiger-mode avalanche photodiode, Photon correlation spectroscopy, X-ray diffraction, X-ray photon correlation spectroscopy",

author = "I. Johnson and Z. Sadygov and O. Bunk and A. Menzel and F. Pfeiffer and D. Renker",

year = "2008",

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AU - Johnson, I.

AU - Sadygov, Z.

AU - Bunk, O.

AU - Menzel, A.

AU - Pfeiffer, F.

AU - Renker, D.

PY - 2008

Y1 - 2008

N2 - X-ray photon correlation spectroscopy (XPCS) provides an opportunity to study the dynamics of systems by measuring the temporal fluctuations in a far-field diffraction pattern. A two-dimensional detector system has been developed to investigate fluctuations in the frequency range of several Hz to kHz. The X-ray detector system consists of a thin 100 m scintillation crystal coupled to a Geiger-mode avalanche photodiode array. In this article the elements of the system are detailed and the detector for XPCS measurements is demonstrated.

AB - X-ray photon correlation spectroscopy (XPCS) provides an opportunity to study the dynamics of systems by measuring the temporal fluctuations in a far-field diffraction pattern. A two-dimensional detector system has been developed to investigate fluctuations in the frequency range of several Hz to kHz. The X-ray detector system consists of a thin 100 m scintillation crystal coupled to a Geiger-mode avalanche photodiode array. In this article the elements of the system are detailed and the detector for XPCS measurements is demonstrated.

KW - Detector

KW - Dynamic light scattering

KW - Geiger-mode avalanche photodiode

KW - Photon correlation spectroscopy

KW - X-ray diffraction

KW - X-ray photon correlation spectroscopy

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EP - 109

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

IS - 1

ER -

A Geiger-mode avalanche photodiode array for X-ray photon correlation spectroscopy

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Keywords

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