TY - JOUR
T1 - A direct evidence of morphological degradation on a nanometer scale in polymer solar cells
AU - Schaffer, Christoph J.
AU - Palumbiny, Claudia M.
AU - Niedermeier, Martin A.
AU - Jendrzejewski, Christian
AU - Santoro, Gonzalo
AU - Roth, Stephan V.
AU - Müller-Buschbaum, Peter
PY - 2013/12/10
Y1 - 2013/12/10
N2 - In situ measurement of a polymer solar cell using micro grazing incidence small angle X-ray scattering (μGISAXS) and current-voltage tracking is demonstrated. While measuring electric characteristics under illumination, morphological changes are probed by μGISAXS. The X-ray beam (green) impinges on the photo active layer with a shallow angle and scatters on a 2d detector. Degradation is explained by the ongoing nanomorphological changes observed.
AB - In situ measurement of a polymer solar cell using micro grazing incidence small angle X-ray scattering (μGISAXS) and current-voltage tracking is demonstrated. While measuring electric characteristics under illumination, morphological changes are probed by μGISAXS. The X-ray beam (green) impinges on the photo active layer with a shallow angle and scatters on a 2d detector. Degradation is explained by the ongoing nanomorphological changes observed.
KW - bulk heterojunction
KW - degradation
KW - in situ grazing incidence small angle X-ray scattering (GISAXS)
KW - morphology
KW - organic photovoltaics
UR - http://www.scopus.com/inward/record.url?scp=84890127562&partnerID=8YFLogxK
U2 - 10.1002/adma.201302854
DO - 10.1002/adma.201302854
M3 - Article
C2 - 24027092
AN - SCOPUS:84890127562
SN - 0935-9648
VL - 25
SP - 6760
EP - 6764
JO - Advanced Materials
JF - Advanced Materials
IS - 46
ER -