TY - GEN
T1 - A De-embedding application for EMC attenuation measurements of components
AU - Hein, Janne
AU - Hippeli, Johannes
AU - Eibert, Thomas F.
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/11/2
Y1 - 2017/11/2
N2 - The utilization of the de-embedding method for Electromagnetic Compatibility (EMC) component measurements in automotive applications presents a practicable solution approach for improved attenuation measurement results of the device under test (DUT). The attenuation of a component prevents the passing on of conducted emissions inside the car from the mostly screened high-voltage level to the unshielded low-voltage level. The goal is the definition of component properties without the influence of the measurement setup. The measurement setup needs to be subtracted out of the total test fixture to get more reliable results for the DUT. The application of the de-embedding method is shown for attenuation measurements with a known attenuator and discrete components in the measurement setup to be exemplary for active state high-voltage components and Line Impedance Stabilization Networks (LISNs) in automotive industry. The LISNs are used for EMC measurements, because of the active state measurements of high-voltage components. The simplified test setup with a known passive component is used to isolate and analyze the influence of the measurement setup with LISNs. Validations of the de-embedding method and de-embedding results as well as corresponding simulation results are presented for the generic DUT.
AB - The utilization of the de-embedding method for Electromagnetic Compatibility (EMC) component measurements in automotive applications presents a practicable solution approach for improved attenuation measurement results of the device under test (DUT). The attenuation of a component prevents the passing on of conducted emissions inside the car from the mostly screened high-voltage level to the unshielded low-voltage level. The goal is the definition of component properties without the influence of the measurement setup. The measurement setup needs to be subtracted out of the total test fixture to get more reliable results for the DUT. The application of the de-embedding method is shown for attenuation measurements with a known attenuator and discrete components in the measurement setup to be exemplary for active state high-voltage components and Line Impedance Stabilization Networks (LISNs) in automotive industry. The LISNs are used for EMC measurements, because of the active state measurements of high-voltage components. The simplified test setup with a known passive component is used to isolate and analyze the influence of the measurement setup with LISNs. Validations of the de-embedding method and de-embedding results as well as corresponding simulation results are presented for the generic DUT.
UR - http://www.scopus.com/inward/record.url?scp=85040540061&partnerID=8YFLogxK
U2 - 10.1109/EMCEurope.2017.8094678
DO - 10.1109/EMCEurope.2017.8094678
M3 - Conference contribution
AN - SCOPUS:85040540061
T3 - 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017
BT - 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC Europe 2017
Y2 - 4 September 2017 through 8 September 2017
ER -