90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization

Stephan Henzler; Siegmar Koeppe; Winfried Kamp; Hans Mulatz; Doris Schmitt-Landsiedel

doi:10.1109/ISSCC.2008.4523300

90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization

Stephan Henzler, Siegmar Koeppe, Winfried Kamp, Hans Mulatz, Doris Schmitt-Landsiedel

Medicine and Health

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

93 Scopus citations

Abstract

The concept and on-chip characterization circuitry of a 90nm local passive interpolation TDC is presented. With an interpolation factor of 4, the resolution is 4.7ps at 1.2V with 0.7 LSB single-shot precision at 19pJ/shot power consumption. The measured INL and DNL are ±1.2 and ±0.6 LSB, respectively. Active compensation limits the error caused by 10ps_rms long-term clock jitter to ±1LSB.

Original language	English
Title of host publication	2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	548-550
Number of pages	3
ISBN (Print)	9781424420100
DOIs	https://doi.org/10.1109/ISSCC.2008.4523300
State	Published - 2008
Event	2008 IEEE International Solid State Circuits Conference, ISSCC - San Francisco, CA, United States Duration: 3 Feb 2008 → 7 Feb 2008

Publication series

Name	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume	51
ISSN (Print)	0193-6530

Conference

Conference	2008 IEEE International Solid State Circuits Conference, ISSCC
Country/Territory	United States
City	San Francisco, CA
Period	3/02/08 → 7/02/08

Access to Document

10.1109/ISSCC.2008.4523300

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Henzler, S., Koeppe, S., Kamp, W., Mulatz, H., & Schmitt-Landsiedel, D. (2008). 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. In 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC (pp. 548-550). Article 4523300 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 51). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2008.4523300

Henzler, Stephan ; Koeppe, Siegmar ; Kamp, Winfried et al. / 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC. Institute of Electrical and Electronics Engineers Inc., 2008. pp. 548-550 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

@inproceedings{fd0b3ab60eef4dda9ee03b5b46e9d1c4,

title = "90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization",

abstract = "The concept and on-chip characterization circuitry of a 90nm local passive interpolation TDC is presented. With an interpolation factor of 4, the resolution is 4.7ps at 1.2V with 0.7 LSB single-shot precision at 19pJ/shot power consumption. The measured INL and DNL are ±1.2 and ±0.6 LSB, respectively. Active compensation limits the error caused by 10psrms long-term clock jitter to ±1LSB.",

author = "Stephan Henzler and Siegmar Koeppe and Winfried Kamp and Hans Mulatz and Doris Schmitt-Landsiedel",

year = "2008",

doi = "10.1109/ISSCC.2008.4523300",

language = "English",

isbn = "9781424420100",

series = "Digest of Technical Papers - IEEE International Solid-State Circuits Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "548--550",

booktitle = "2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC",

note = "2008 IEEE International Solid State Circuits Conference, ISSCC ; Conference date: 03-02-2008 Through 07-02-2008",

}

Henzler, S, Koeppe, S, Kamp, W, Mulatz, H & Schmitt-Landsiedel, D 2008, 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. in 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC., 4523300, Digest of Technical Papers - IEEE International Solid-State Circuits Conference, vol. 51, Institute of Electrical and Electronics Engineers Inc., pp. 548-550, 2008 IEEE International Solid State Circuits Conference, ISSCC, San Francisco, CA, United States, 3/02/08. https://doi.org/10.1109/ISSCC.2008.4523300

90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. / Henzler, Stephan; Koeppe, Siegmar; Kamp, Winfried et al.
2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC. Institute of Electrical and Electronics Engineers Inc., 2008. p. 548-550 4523300 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 51).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Henzler S, Koeppe S, Kamp W, Mulatz H, Schmitt-Landsiedel D. 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. In 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC. Institute of Electrical and Electronics Engineers Inc. 2008. p. 548-550. 4523300. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). doi: 10.1109/ISSCC.2008.4523300

90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization

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