Abstract
In this Letter, we demonstrate the operation of an in-plane magnetic field sensitive 4H-SiC vertical magnetotransistor over a wide range of temperatures, ranging from room temperature up to 500 °C. The sensor is realized using the ion-implanted wells of a wafer-scale 4H-SiC Bipolar-CMOS-DMOS technology. We measure and analyze the sensor's DC characteristics, magnetic sensitivity, linearity, and noise performance and determine the achievable magnetic detectivity, which lies in the low μT/ H z regime up to 500 °C. Furthermore, we elaborate on the origin of the observed magnetic sensitivity using TCAD simulations.
Original language | English |
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Article number | 192101 |
Journal | Applied Physics Letters |
Volume | 124 |
Issue number | 19 |
DOIs | |
State | Published - 6 May 2024 |