Abstract
A novel organometallic precursor has been synthesized and used for the deposition of amorphous germanium by thermal OM CVD (Qrganometallic chemical zapour deposition) at temperatures below 300 °C. The films are of high purity with an oxygen content below the detection limit of about ≤ 1018 cm-3. OM CVD from a novel precursor 2,5-Bis(tbutyl)-2,5-diaza-l-germa-cyclopentane is a promising alternative for the deposition of a-Ge at low temperature. Oxygen, nitrogen, and carbon impurities of the films are very low, but their electrical properties do not reach the quality of the best plasma CVD material. Work is in progress to solve these problems.
Original language | English |
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Title of host publication | Organosilicon Chemistry II |
Subtitle of host publication | From Molecules to Materials |
Publisher | Wiley Blackwell |
Pages | 815-820 |
Number of pages | 6 |
ISBN (Electronic) | 9783527619894 |
ISBN (Print) | 9783527292547 |
DOIs | |
State | Published - 25 Apr 2008 |
Keywords
- Characterization
- Deposition
- Mechanism
- Organometallic
- Semiconductor