Abstract
We have measured the low-frequency 1/f voltage noise of Bi2Sr2CaCu2O8+x bicrystal grain-boundary Josephson junctions (GBJ's). The origin of the 1/f noise are fluctuations δIc and δRn of their critical current and normal resistance, respectively. The ratio p of the normalized fluctuations δIc/IcδRn/Rn is found to be p=1.9±0.25 independent of temperature. The analysis of the noise data indicates that the critical current and resistance fluctuations are correlated. The measured noise properties can be consistently explained by the intrinsically shunted junction model based on an insulating layer at the grain boundary containing a high density of localized defect states.
| Original language | English |
|---|---|
| Pages (from-to) | 6735-6738 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 51 |
| Issue number | 10 |
| DOIs | |
| State | Published - 1995 |
| Externally published | Yes |