Schowalter, M., Melzer, M., Rosenauer, A., Gerthsen, D., Krebs, R., Reithmaier, J. P., Forchel, A., Arzberger, M., Bichler, M., Abstreiter, G., Grau, M., Amann, M. C., Sellin, R. & Bimberg, D., 1 Jan 2018, Microscopy of Semiconducting Materials 2003.CRC Press, p. 127-1304 p.
Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review