TY - GEN
T1 - Unsupervised discovery of repetitive objects
AU - Shin, Jiwon
AU - Triebel, Rudolph
AU - Siegwart, Roland
PY - 2010
Y1 - 2010
N2 - We present a novel approach for unsupervised discovery of repetitive objects from 3D point clouds. Our method assumes that objects are non-deformable and uses multiple occurrences of an object as the evidence for its existence. We segment input range data by superpixel segmentation and extract features for each segment. We search for a group of segments where each segment matches a segment in another group using a joint compatibility test. The discovered objects are then verified by the Iterative Closest Point algorithm to remove false matches. The presented method was tested on real data of complex objects. The experiments demonstrate that the proposed approach is capable of finding objects that occur multiple times in a scene and distinguish apart those objects of different types.
AB - We present a novel approach for unsupervised discovery of repetitive objects from 3D point clouds. Our method assumes that objects are non-deformable and uses multiple occurrences of an object as the evidence for its existence. We segment input range data by superpixel segmentation and extract features for each segment. We search for a group of segments where each segment matches a segment in another group using a joint compatibility test. The discovered objects are then verified by the Iterative Closest Point algorithm to remove false matches. The presented method was tested on real data of complex objects. The experiments demonstrate that the proposed approach is capable of finding objects that occur multiple times in a scene and distinguish apart those objects of different types.
UR - http://www.scopus.com/inward/record.url?scp=77955811850&partnerID=8YFLogxK
U2 - 10.1109/ROBOT.2010.5509914
DO - 10.1109/ROBOT.2010.5509914
M3 - Conference contribution
AN - SCOPUS:77955811850
SN - 9781424450381
T3 - Proceedings - IEEE International Conference on Robotics and Automation
SP - 5041
EP - 5046
BT - 2010 IEEE International Conference on Robotics and Automation, ICRA 2010
T2 - 2010 IEEE International Conference on Robotics and Automation, ICRA 2010
Y2 - 3 May 2010 through 7 May 2010
ER -