Ecker, W, Adelt, P, Mueller, W, Heckmann, R, Krstic, M, Herdt, V, Drechsler, R, Angst, G, Wimmer, R, Mauderer, A, Stahl, R, Emrich, K
, Mueller-Gritschneder, D, Becker, B, Scholl, P, Jentzsch, E, Schlamelcher, J, Gruttner, K, Bernardo, PP, Bringmann, O, Damian, M, Oppermann, J, Koch, A, Bormann, J, Partzsch, J, Mayr, C & Kunz, W 2022,
The Scale4Edge RISC-V Ecosystem. in C Bolchini, I Verbauwhede & I Vatajelu (Hrsg.),
Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, Institute of Electrical and Electronics Engineers Inc., S. 808-813, 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, Virtual, Online, Belgien,
14/03/22.
https://doi.org/10.23919/DATE54114.2022.9774593