Superconducting transport properties of step-edge josephson junctions

F. Schmidl; L. Alff; R. Gross; K. D. Husemann; H. Schneidewind; P. Seidel

doi:10.1109/77.233430

Superconducting transport properties of step-edge josephson junctions

F. Schmidl, L. Alff, R. Gross, K. D. Husemann, H. Schneidewind, P. Seidel

Publikation: Beitrag in Fachzeitschrift › Brief › Begutachtung

24 Zitate (Scopus)

Abstract

We have investigated the electrical transport properties of YBa2Cu307-‘ step-edge junctions (SEJs) fabricated on step edges in (100) SrTi03 substrates. In particular, we studied the influence of the step angle and the ratio of the step height and the film thickness on the superconducting properties of the junctions. Steps of different height and angle were patterned into (100) SrTiO3 substrates by ion beam etching (IBE). Epitaxial YBa2Cu3O7-δ films were grown on these substrates by sputtering and patterned by IBE. The samples were characterized by four-probe electrical measurements. The critical current density of the SEJs was found to depend strongly on the ratio of the step height to the film thickness. The critical current density distribution of the SEJs was imaged by Low Temperature Scanning Electron Microscopy (LTSEM) and was found to be strongly inhomo-geneous.

Originalsprache	Englisch
Seiten (von - bis)	2349-2352
Seitenumfang	4
Fachzeitschrift	IEEE Transactions on Applied Superconductivity
Jahrgang	3
Ausgabenummer	1
DOIs	https://doi.org/10.1109/77.233430
Publikationsstatus	Veröffentlicht - März 1993
Extern publiziert	Ja

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abstract = "We have investigated the electrical transport properties of YBa2Cu307-{\textquoteleft} step-edge junctions (SEJs) fabricated on step edges in (100) SrTi03 substrates. In particular, we studied the influence of the step angle and the ratio of the step height and the film thickness on the superconducting properties of the junctions. Steps of different height and angle were patterned into (100) SrTiO3 substrates by ion beam etching (IBE). Epitaxial YBa2Cu3O7-δ films were grown on these substrates by sputtering and patterned by IBE. The samples were characterized by four-probe electrical measurements. The critical current density of the SEJs was found to depend strongly on the ratio of the step height to the film thickness. The critical current density distribution of the SEJs was imaged by Low Temperature Scanning Electron Microscopy (LTSEM) and was found to be strongly inhomo-geneous.",

author = "F. Schmidl and L. Alff and R. Gross and Husemann, {K. D.} and H. Schneidewind and P. Seidel",

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AU - Schmidl, F.

AU - Alff, L.

AU - Gross, R.

AU - Husemann, K. D.

AU - Schneidewind, H.

AU - Seidel, P.

PY - 1993/3

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Superconducting transport properties of step-edge josephson junctions

Abstract

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