Struktur-Untersuchung überkonsolidierter Tone mit dem Raster-Kraftmikroskop (AFM)

Keyphrases

• Atomic Force Microscope 100%
• Over-consolidated Clay 100%
• Mechanical Properties 25%
• Soil Structure 25%
• Nanometer Scale 25%
• Pore Structure 25%
• Scanning Electron Microscope 25%
• Micromechanical Modeling 25%
• Surface Analysis 25%
• Void Fraction 25%
• Effective Stress 25%
• Particle Structure 25%
• Sample Orientation 25%
• Optical Microscope 25%
• Soil History 25%
• Soil Mechanics 25%
• Derived Values 25%
• Fine-grained Soils 25%
• Overconsolidation Ratio 25%
• Plastic Clay 25%
• Microscope Method 25%
• Loading Orientation 25%
• Comparison Images 25%

Engineering

• Atomic Force Microscope 100%
• Powerful Tool 25%
• Nanometre 25%
• Soil Mechanics 25%
• Grained Soil 25%
• Overconsolidation Ratio 25%
• Dependent Mechanical Property 25%
• Micromechanics Model 25%
• Effective Stress 25%
• Optical Microscope 25%
• Scanning Electron Microscope 25%