Struktur-Untersuchung überkonsolidierter Tone mit dem Raster-Kraftmikroskop (AFM)

Preloaded fine-grained soils show different mechanical properties dependent on soil history and especially geological loading and sample orientation. For characterization of soil structure, the generally used terms "void ratio" and "effective stress" are not sufficient, because they describe averaged macroscopic values. The same applies for derived quantities as for example the overconsolidation ratio. To obtain fundamental data for detailed description of particle- and pore-structure, recordings by different visualizing techniques were made with two high plastic clays and were analysed quantitatively. For comparison, images were taken by a scanning electron microscope (REM) and an optical microscope (LM). Mainly the Atomic Force Microscope (AFM) was used, which is a powerful tool for surface analysis on nanometer scale since the 1980s. The insights will improve micromechanic models of water bonding in soils, where the AFM method in the field of soil mechanics still offers further possibilities.