Stroboscopic Video Microscopy for In-Plane Motion Measurements up to 2 MHz with Picometer Resolution

Andrej Voss, Lars Seyfert, Werner Hemmert

Publikation: Beitrag in Buch/Bericht/KonferenzbandKonferenzbeitragBegutachtung

3 Zitate (Scopus)

Abstract

We present a setup for measuring in-plane motion of MEMS with picometer resolution. The system uses stroboscopic video microscopy to capture image sequences from periodic motions that are analyzed with gradient-based sub-pixel algorithms.The performance of the setup was demonstrated by measuring the frequency response along the length of an atomic-force cantilever and a dense mapping of the strain field on the surface of a flexoelectric MEMS device.Results demonstrate the superiority of our system compared to previous systems: 50 pm noise floor in single-shot experiments and frequency range up to 2 MHz.

OriginalspracheEnglisch
Titel34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seiten1040-1043
Seitenumfang4
ISBN (elektronisch)9781665419123
DOIs
PublikationsstatusVeröffentlicht - 25 Jan. 2021
Veranstaltung34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021 - Virtual, Gainesville, USA/Vereinigte Staaten
Dauer: 25 Jan. 202129 Jan. 2021

Publikationsreihe

NameProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
Band2021-January
ISSN (Print)1084-6999

Konferenz

Konferenz34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021
Land/GebietUSA/Vereinigte Staaten
OrtVirtual, Gainesville
Zeitraum25/01/2129/01/21

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