@inproceedings{2cb759862d3d44cb9c904ebc0f77d3ec,
title = "Simulations of multi-contrast X-ray imaging using near-field speckles",
abstract = "X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption X-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.",
keywords = "X-ray microscopy, dark-field imaging, near-field speckles, phase-contrast imaging, synchrotron radiation, wavefront simulations",
author = "Zdora, {Marie Christine} and Pierre Thibault and Julia Herzen and Franz Pfeiffer and Irene Zanette",
note = "Publisher Copyright: {\textcopyright} 2016 AIP Publishing LLC.; 12th International Conference on X-Ray Microscopy, XRM 2014 ; Conference date: 26-10-2014 Through 31-10-2014",
year = "2016",
month = jan,
day = "28",
doi = "10.1063/1.4937510",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
editor = "{de Jonge}, {Martin D.} and Paterson, {David J.} and Ryan, {Christopher G.}",
booktitle = "XRM 2014",
}