Self-metalation of 2H-tetraphenylporphyrin on Cu(111): An x-ray spectroscopy study

K. Diller, F. Klappenberger, M. Marschall, K. Hermann, A. Nefedov, Ch Wöll, J. V. Barth

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

149 Zitate (Scopus)

Abstract

The bonding and the temperature-driven metalation of 2H- tetraphenylporphyrin (2H-TPP) on the Cu(111) surface under ultrahigh vacuum conditions were investigated by a combination of x-ray photoelectron spectroscopy (XPS) and near-edge x-ray absorption fine structure (NEXAFS) spectroscopy with density functional theory calculations. Thin films were prepared by organic molecular beam epitaxy and subsequent annealing. Our systematic study provides an understanding of the changes of the spectroscopic signature during adsorption and metalation. Specifically, we achieved a detailed peak assignment of the 2H-TPP multilayer data of the C1s and the N1s region. After annealing to 420 K both XPS and NEXAFS show the signatures of a metalloporphyrin, which indicates self-metalation at the porphyrin-substrate interface, resulting in Cu-TPP. Furthermore, for 2H-TPP monolayer samples we show how the strong influence of the copper surface is reflected in the spectroscopic signatures. Adsorption results in a strongly deformed macrocycle and a quenching of the first NEXAFS resonance in the nitrogen edge suggesting electron transfer into the LUMO. For Cu-TPP the spectroscopic data indicate a reduced interaction of first-layer molecules with the substrate as demonstrated by the relaxed macrocycle geometry.

OriginalspracheEnglisch
Aufsatznummer014705
FachzeitschriftJournal of Chemical Physics
Jahrgang136
Ausgabenummer1
DOIs
PublikationsstatusVeröffentlicht - 7 Jan. 2012

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