Scribing into hydrogenated diamond surfaces using atomic force microscopy

B. Rezek, C. Sauerer, J. A. Garrido, C. E. Nebel, M. Stutzmann, E. Snidero, P. Bergonzo

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

19 Zitate (Scopus)

Abstract

The surface termination of hydrogenated diamond surfaces with lateral resolution of ∼ 10 nm was controlled using atomic force microscopy (AFM). Microscopic patterns can be scribed into a diamond surface, up to a depth of 3 nm using negatively biased silicon cantilevers. Electron affinity and conductivity were exhibited to the rest of the surface by the inscribed patterns. The effect of noncontact and contact AFM on pattern appearance was also discussed.

OriginalspracheEnglisch
Seiten (von - bis)3336-3338
Seitenumfang3
FachzeitschriftApplied Physics Letters
Jahrgang82
Ausgabenummer19
DOIs
PublikationsstatusVeröffentlicht - 12 Mai 2003

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