TY - CHAP
T1 - Scanning probe microscopy and grazing-incidence small-angle scattering as complementary tools for the investigation of polymer films and surfaces
AU - Müller-Buschbaum, Peter
AU - Körstgens, Volker
N1 - Funding Information:
The authors thank the Bundesministerium für Bildung und Forschung for financial support (grant 05KS7WO1).
PY - 2011
Y1 - 2011
N2 - The real-space analysis, based on scanning probe microscopy (SPM) techniques and the advanced scattering technique grazing-incidence small-angle scattering (GISAS), are complementary tools for the structural analysis of nanostructures. GISAS experiments can be performed with X-rays, named grazingincidence small-angle X-ray scattering (GISAXS) and with neutrons, denoted GISANS, respectively. On selected examples of polymer films and surfaces, these complementarities are illustrated. Master curves of power spectral densities calculated from the SPM data may give an equivalent information as compared with GISAS data as long as the SPM measurement is representative in a statistical meaning for a larger area as it is addressed with GISAS. Moreover, GISAS allows for accessing buried structures that are hardly addressable with SPM.
AB - The real-space analysis, based on scanning probe microscopy (SPM) techniques and the advanced scattering technique grazing-incidence small-angle scattering (GISAS), are complementary tools for the structural analysis of nanostructures. GISAS experiments can be performed with X-rays, named grazingincidence small-angle X-ray scattering (GISAXS) and with neutrons, denoted GISANS, respectively. On selected examples of polymer films and surfaces, these complementarities are illustrated. Master curves of power spectral densities calculated from the SPM data may give an equivalent information as compared with GISAS data as long as the SPM measurement is representative in a statistical meaning for a larger area as it is addressed with GISAS. Moreover, GISAS allows for accessing buried structures that are hardly addressable with SPM.
UR - http://www.scopus.com/inward/record.url?scp=84866992661&partnerID=8YFLogxK
U2 - 10.1007/978-3-642-10497-8_4
DO - 10.1007/978-3-642-10497-8_4
M3 - Chapter
AN - SCOPUS:84866992661
SN - 9783642104961
T3 - NanoScience and Technology
SP - 101
EP - 134
BT - Scanning Probe Microscopy in Nanoscience and Nanotechnology
PB - Springer Verlag
ER -