Roughness correlations in ultra-thin polymer blend films

J. S. Gutmann; P. Müller-Buschbaum; D. W. Schubert; N. Stribeck; D. Smilgies; M. Stamm

doi:10.1016/S0921-4526(99)01888-8

Roughness correlations in ultra-thin polymer blend films

J. S. Gutmann, P. Müller-Buschbaum, D. W. Schubert, N. Stribeck, D. Smilgies, M. Stamm

Lehrstuhl für Funktionelle Materialien

Publikation: Beitrag in Fachzeitschrift › Konferenzartikel › Begutachtung

21 Zitate (Scopus)

Abstract

Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr_0.91S/PBr_0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.

Originalsprache	Englisch
Seiten (von - bis)	40-44
Seitenumfang	5
Fachzeitschrift	Physica B: Condensed Matter
Jahrgang	283
Ausgabenummer	1-3
DOIs	https://doi.org/10.1016/S0921-4526(99)01888-8
Publikationsstatus	Veröffentlicht - Juni 2000
Veranstaltung	6th International Conference on Surface X-ray and Neutron Scattering (SXNS-6) - Noordwijkerhout, Neth Dauer: 12 Sept. 1999 → 17 Sept. 1999

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abstract = "Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr0.91S/PBr0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.",

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AU - Gutmann, J. S.

AU - Müller-Buschbaum, P.

AU - Schubert, D. W.

AU - Stribeck, N.

AU - Smilgies, D.

AU - Stamm, M.

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N2 - Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr0.91S/PBr0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.

AB - Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr0.91S/PBr0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.

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Roughness correlations in ultra-thin polymer blend films

Abstract

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