TY - CHAP
T1 - On Scenario-Based Testing of Cyber-Physical Systems
AU - Pretschner, Alexander
AU - Hauer, Florian
AU - Schmidt, Tabea
N1 - Publisher Copyright:
© 2023, The Author(s), under exclusive license to Springer Nature Switzerland AG.
PY - 2023
Y1 - 2023
N2 - We present several results on scenario-based testing, an equivalence class testing method typically applied to cyber-physical systems. We show that randomly sampling as well as re-using tests in general is problematic and that instead, new tests need to be generated for each new version of the systems. We discuss empirical results on the power of heuristic search and show that different algorithms lead to largely different results—with some generated test suites finding safety-critical behavior and some failing to do so. Finally, we present different dimensions of and criteria for completeness of scenario-based test suites.
AB - We present several results on scenario-based testing, an equivalence class testing method typically applied to cyber-physical systems. We show that randomly sampling as well as re-using tests in general is problematic and that instead, new tests need to be generated for each new version of the systems. We discuss empirical results on the power of heuristic search and show that different algorithms lead to largely different results—with some generated test suites finding safety-critical behavior and some failing to do so. Finally, we present different dimensions of and criteria for completeness of scenario-based test suites.
UR - http://www.scopus.com/inward/record.url?scp=85169073798&partnerID=8YFLogxK
U2 - 10.1007/978-3-031-40132-9_5
DO - 10.1007/978-3-031-40132-9_5
M3 - Chapter
AN - SCOPUS:85169073798
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 68
EP - 82
BT - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
PB - Springer Science and Business Media Deutschland GmbH
ER -