Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry

V. Körstgens; R. Meier; M. A. Ruderer; S. Guo; H. Y. Chiang; J. Perlich; S. V. Roth; R. Gehrke; P. Müller-Buschbaum

doi:10.1063/1.4738880

Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry

V. Körstgens, R. Meier, M. A. Ruderer, S. Guo, H. Y. Chiang, J. Perlich, S. V. Roth, R. Gehrke, P. Müller-Buschbaum

Lehrstuhl für Funktionelle Materialien

Publikation: Beitrag in Fachzeitschrift › Übersichtsartikel › Begutachtung

5 Zitate (Scopus)

Abstract

The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS) with optical imaging ellipsometry is presented as an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor. The instrument is introduced with the description of the alignment procedure to assure the measurement of imaging ellipsometry and GISAXSGIWAXS on the same sample spot. To demonstrate the possibilities of the new instrument examples of morphological investigation on films made of poly(3-hexylthiophene) and 6,6-phenyl-C ₆₁ butyric acid methyl ester as well as textured poly(9,9-dioctylfluorene-alt-benzo-thia-diazole) are shown.

Originalsprache	Englisch
Aufsatznummer	076107
Fachzeitschrift	Review of Scientific Instruments
Jahrgang	83
Ausgabenummer	7
DOIs	https://doi.org/10.1063/1.4738880
Publikationsstatus	Veröffentlicht - Juli 2012

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10.1063/1.4738880

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title = "Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry",

abstract = "The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS) with optical imaging ellipsometry is presented as an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor. The instrument is introduced with the description of the alignment procedure to assure the measurement of imaging ellipsometry and GISAXSGIWAXS on the same sample spot. To demonstrate the possibilities of the new instrument examples of morphological investigation on films made of poly(3-hexylthiophene) and 6,6-phenyl-C 61 butyric acid methyl ester as well as textured poly(9,9-dioctylfluorene-alt-benzo-thia-diazole) are shown.",

author = "V. K{\"o}rstgens and R. Meier and Ruderer, {M. A.} and S. Guo and Chiang, {H. Y.} and J. Perlich and Roth, {S. V.} and R. Gehrke and P. M{\"u}ller-Buschbaum",

note = "Funding Information: This work has been supported by the Bundesministerium f{\"u}r Bildung und Forschung (Grant No. 05KS7WO1). M.A.R. thanks the Bavarian State Ministry of Sciences, Research and Arts for funding through the International Graduate School “Materials Science of Complex Interfaces”. S.G. and H.Y.C. were financially supported by the Erasmus Mundus MaMaSELF program.",

year = "2012",

month = jul,

doi = "10.1063/1.4738880",

language = "English",

volume = "83",

journal = "Review of Scientific Instruments",

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publisher = "American Institute of Physics",

number = "7",

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T2 - Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry

AU - Körstgens, V.

AU - Meier, R.

AU - Ruderer, M. A.

AU - Guo, S.

AU - Chiang, H. Y.

AU - Perlich, J.

AU - Roth, S. V.

AU - Gehrke, R.

AU - Müller-Buschbaum, P.

N1 - Funding Information: This work has been supported by the Bundesministerium für Bildung und Forschung (Grant No. 05KS7WO1). M.A.R. thanks the Bavarian State Ministry of Sciences, Research and Arts for funding through the International Graduate School “Materials Science of Complex Interfaces”. S.G. and H.Y.C. were financially supported by the Erasmus Mundus MaMaSELF program.

PY - 2012/7

Y1 - 2012/7

N2 - The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS) with optical imaging ellipsometry is presented as an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor. The instrument is introduced with the description of the alignment procedure to assure the measurement of imaging ellipsometry and GISAXSGIWAXS on the same sample spot. To demonstrate the possibilities of the new instrument examples of morphological investigation on films made of poly(3-hexylthiophene) and 6,6-phenyl-C 61 butyric acid methyl ester as well as textured poly(9,9-dioctylfluorene-alt-benzo-thia-diazole) are shown.

AB - The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS) with optical imaging ellipsometry is presented as an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor. The instrument is introduced with the description of the alignment procedure to assure the measurement of imaging ellipsometry and GISAXSGIWAXS on the same sample spot. To demonstrate the possibilities of the new instrument examples of morphological investigation on films made of poly(3-hexylthiophene) and 6,6-phenyl-C 61 butyric acid methyl ester as well as textured poly(9,9-dioctylfluorene-alt-benzo-thia-diazole) are shown.

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JF - Review of Scientific Instruments

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ER -

Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry

Abstract

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