Non-Local SAR Tomography for Large-Scale Urban Mapping

Publikation: Beitrag in Buch/Bericht/KonferenzbandKonferenzbeitragBegutachtung

6 Zitate (Scopus)

Abstract

Multi-baseline synthetic aperture radar (SAR) interferometric techniques, such as SAR tomography, is well established for 3-D reconstruction in the urban area. These methods usually require fairly large interferometric stacks (> 20 images) for a reliable reconstruction. Hence, they are usually not directly applicable for large-scale 3-D urban mapping using TanDEM-X data where only a few acquisitions are available in average for each city. This work proposes a new SAR tomographic processing framework to those extremely small stacks. The applicability of the algorithm is demonstrated using a TanDEM-X multi-baseline stack with five bistatic interferograms over the whole city of Munich, Germany. Systematic comparison of our result with TanDEM-X raw digital elevation models (DEM) and airborne LiDAR data shows that the relative height accuracy is two meters, which outperforms the TanDEM-X raw DEM. The promising performance of the proposed algorithm paved the first step towards high quality large-scale 3-D urban mapping.

OriginalspracheEnglisch
Titel2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seiten5197-5200
Seitenumfang4
ISBN (elektronisch)9781538691540
DOIs
PublikationsstatusVeröffentlicht - Juli 2019
Veranstaltung39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Yokohama, Japan
Dauer: 28 Juli 20192 Aug. 2019

Publikationsreihe

NameInternational Geoscience and Remote Sensing Symposium (IGARSS)

Konferenz

Konferenz39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019
Land/GebietJapan
OrtYokohama
Zeitraum28/07/192/08/19

Fingerprint

Untersuchen Sie die Forschungsthemen von „Non-Local SAR Tomography for Large-Scale Urban Mapping“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren