TY - JOUR
T1 - Nanometer focusing properties of Fresnel zone plates described by dynamical diffraction theory
AU - Pfeiffer, F.
AU - David, C.
AU - Van Der Veen, J. F.
AU - Bergemann, C.
PY - 2006
Y1 - 2006
N2 - The x-ray focusing properties of linear Fresnel zone plates have been derived by solving the Helmholtz equation for the field propagating through the zones. We consider the imaging of a point object into the first diffraction order of a volume zone plate having its zones parallel to the optical axis. For plane wave illumination, the focal spot size is limited by the same material-dependent but wavelength-independent value that affects waveguide focusing. In marked contrast, for the one-to-one imaging condition, corresponding to specular reflection of the x rays from the zone boundaries, the image is found to have a minimal spot size approximately equal to the outermost zone width. Unlike x-ray waveguides, zone plates therefore do not appear to possess a fundamental limit to the smallest spot size to which they can focus.
AB - The x-ray focusing properties of linear Fresnel zone plates have been derived by solving the Helmholtz equation for the field propagating through the zones. We consider the imaging of a point object into the first diffraction order of a volume zone plate having its zones parallel to the optical axis. For plane wave illumination, the focal spot size is limited by the same material-dependent but wavelength-independent value that affects waveguide focusing. In marked contrast, for the one-to-one imaging condition, corresponding to specular reflection of the x rays from the zone boundaries, the image is found to have a minimal spot size approximately equal to the outermost zone width. Unlike x-ray waveguides, zone plates therefore do not appear to possess a fundamental limit to the smallest spot size to which they can focus.
UR - http://www.scopus.com/inward/record.url?scp=33745498408&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.73.245331
DO - 10.1103/PhysRevB.73.245331
M3 - Article
AN - SCOPUS:33745498408
SN - 1098-0121
VL - 73
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 24
M1 - 245331
ER -