Multi-probe near-field measurement of stochastic noisy radiations: Perspectives for chip-package LNA-probe co-design

Sidina Wane; Damienne Bajon; Dominique Lesénéchal; Johannes A. Russer; David Thomas; Peter Russer

doi:10.1109/EuMC.2016.7824401

Multi-probe near-field measurement of stochastic noisy radiations: Perspectives for chip-package LNA-probe co-design

Sidina Wane, Damienne Bajon, Dominique Lesénéchal, Johannes A. Russer, David Thomas, Peter Russer

Technische Universität München

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

3 Zitate (Scopus)

Abstract

Near-Field scanning systems operating in the Frequency-domain are used for the measurement of radiated emissions from Wireless Chip-to-Chip communication Link. Alternative Time-Domain based Two-Probe Near-Field scanning solutions suitable for stochastic signals and accounting for Field-Field correlations are presented. Chip-Package-PCB Co-Design approach is proposed for high spatial resolution Multi-Probe Near-Field scanning systems with controlled sensitivity and noise uncertainties. Perspectives towards distributed Co-Design of LNA-Probe arrays are drawn for Energy sensing.

Originalsprache	Englisch
Titel	European Microwave Week 2016
Untertitel	"Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers Inc.
Seiten	548-551
Seitenumfang	4
ISBN (elektronisch)	9782874870439
DOIs	https://doi.org/10.1109/EuMC.2016.7824401
Publikationsstatus	Veröffentlicht - 2016
Veranstaltung	46th European Microwave Conference, EuMC 2016 - London, Großbritannien/Vereinigtes Königreich Dauer: 4 Okt. 2016 → 6 Okt. 2016

Publikationsreihe

Name	European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016

Konferenz

Konferenz	46th European Microwave Conference, EuMC 2016
Land/Gebiet	Großbritannien/Vereinigtes Königreich
Ort	London
Zeitraum	4/10/16 → 6/10/16

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10.1109/EuMC.2016.7824401

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Wane, S., Bajon, D., Lesénéchal, D., Russer, J. A., Thomas, D., & Russer, P. (2016). Multi-probe near-field measurement of stochastic noisy radiations: Perspectives for chip-package LNA-probe co-design. in European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016 (S. 548-551). Artikel 7824401 (European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EuMC.2016.7824401

Wane, Sidina ; Bajon, Damienne ; Lesénéchal, Dominique et al. / Multi-probe near-field measurement of stochastic noisy radiations : Perspectives for chip-package LNA-probe co-design. European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016. Institute of Electrical and Electronics Engineers Inc., 2016. S. 548-551 (European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016).

@inproceedings{63f7de8ca4aa4cafa7e4e45dd0d50151,

title = "Multi-probe near-field measurement of stochastic noisy radiations: Perspectives for chip-package LNA-probe co-design",

abstract = "Near-Field scanning systems operating in the Frequency-domain are used for the measurement of radiated emissions from Wireless Chip-to-Chip communication Link. Alternative Time-Domain based Two-Probe Near-Field scanning solutions suitable for stochastic signals and accounting for Field-Field correlations are presented. Chip-Package-PCB Co-Design approach is proposed for high spatial resolution Multi-Probe Near-Field scanning systems with controlled sensitivity and noise uncertainties. Perspectives towards distributed Co-Design of LNA-Probe arrays are drawn for Energy sensing.",

keywords = "Chip-to-Chip communication, Two-probe near-field measurement",

author = "Sidina Wane and Damienne Bajon and Dominique Les{\'e}n{\'e}chal and Russer, {Johannes A.} and David Thomas and Peter Russer",

note = "Publisher Copyright: {\textcopyright} 2016 EuMA.; 46th European Microwave Conference, EuMC 2016 ; Conference date: 04-10-2016 Through 06-10-2016",

year = "2016",

doi = "10.1109/EuMC.2016.7824401",

language = "English",

series = "European Microwave Week 2016: {"}Microwaves Everywhere{"}, EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "548--551",

booktitle = "European Microwave Week 2016",

}

Wane, S, Bajon, D, Lesénéchal, D, Russer, JA, Thomas, D & Russer, P 2016, Multi-probe near-field measurement of stochastic noisy radiations: Perspectives for chip-package LNA-probe co-design. in European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016., 7824401, European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016, Institute of Electrical and Electronics Engineers Inc., S. 548-551, 46th European Microwave Conference, EuMC 2016, London, Großbritannien/Vereinigtes Königreich, 4/10/16. https://doi.org/10.1109/EuMC.2016.7824401

Multi-probe near-field measurement of stochastic noisy radiations: Perspectives for chip-package LNA-probe co-design. / Wane, Sidina; Bajon, Damienne; Lesénéchal, Dominique et al.
European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016. Institute of Electrical and Electronics Engineers Inc., 2016. S. 548-551 7824401 (European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

TY - GEN

T1 - Multi-probe near-field measurement of stochastic noisy radiations

T2 - 46th European Microwave Conference, EuMC 2016

AU - Wane, Sidina

AU - Bajon, Damienne

AU - Lesénéchal, Dominique

AU - Russer, Johannes A.

AU - Thomas, David

AU - Russer, Peter

PY - 2016

Y1 - 2016

N2 - Near-Field scanning systems operating in the Frequency-domain are used for the measurement of radiated emissions from Wireless Chip-to-Chip communication Link. Alternative Time-Domain based Two-Probe Near-Field scanning solutions suitable for stochastic signals and accounting for Field-Field correlations are presented. Chip-Package-PCB Co-Design approach is proposed for high spatial resolution Multi-Probe Near-Field scanning systems with controlled sensitivity and noise uncertainties. Perspectives towards distributed Co-Design of LNA-Probe arrays are drawn for Energy sensing.

AB - Near-Field scanning systems operating in the Frequency-domain are used for the measurement of radiated emissions from Wireless Chip-to-Chip communication Link. Alternative Time-Domain based Two-Probe Near-Field scanning solutions suitable for stochastic signals and accounting for Field-Field correlations are presented. Chip-Package-PCB Co-Design approach is proposed for high spatial resolution Multi-Probe Near-Field scanning systems with controlled sensitivity and noise uncertainties. Perspectives towards distributed Co-Design of LNA-Probe arrays are drawn for Energy sensing.

KW - Chip-to-Chip communication

KW - Two-probe near-field measurement

UR - http://www.scopus.com/inward/record.url?scp=85015157579&partnerID=8YFLogxK

U2 - 10.1109/EuMC.2016.7824401

DO - 10.1109/EuMC.2016.7824401

M3 - Conference contribution

AN - SCOPUS:85015157579

T3 - European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016

SP - 548

EP - 551

BT - European Microwave Week 2016

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 4 October 2016 through 6 October 2016

ER -

Wane S, Bajon D, Lesénéchal D, Russer JA, Thomas D, Russer P. Multi-probe near-field measurement of stochastic noisy radiations: Perspectives for chip-package LNA-probe co-design. in European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016. Institute of Electrical and Electronics Engineers Inc. 2016. S. 548-551. 7824401. (European Microwave Week 2016: "Microwaves Everywhere", EuMW 2016 - Conference Proceedings; 46th European Microwave Conference, EuMC 2016). doi: 10.1109/EuMC.2016.7824401

Multi-probe near-field measurement of stochastic noisy radiations: Perspectives for chip-package LNA-probe co-design

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