TY - GEN
T1 - Modelling Peripheral Designs using FSM-like Notation for Complete Property Set Generation
AU - Kaja, Endri
AU - Gerlin, Nicolas
AU - Kunzelmann, Robert
AU - Devarajegowda, Keerthikumara
AU - Ecker, Wolfgang
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - As the complexity of System-on-Chips (SoCs) continues to increase, there is a growing need for new and effective design, modeling, and verification methods to produce high-quality designs. To address this challenge, this paper proposes a trace-based approach for generating a complete set of formal properties that can be used to formally verify designs. The proposed approach employs FSM-like notations to model the sequential behavior of designs, including timing information between state transitions. This enables the generation of formal properties that capture all necessary design details. The approach has been applied to several industry-level designs, demonstrating its practicality and effectiveness. Experimental results show that the proposed approach significantly reduces the manual effort required for design verification, while simultaneously identifying several complex bugs that would have otherwise been difficult to detect. Overall, the trace-based approach presented in this paper represents a promising step towards addressing the design and verification challenges posed by increasingly complex SoCs.
AB - As the complexity of System-on-Chips (SoCs) continues to increase, there is a growing need for new and effective design, modeling, and verification methods to produce high-quality designs. To address this challenge, this paper proposes a trace-based approach for generating a complete set of formal properties that can be used to formally verify designs. The proposed approach employs FSM-like notations to model the sequential behavior of designs, including timing information between state transitions. This enables the generation of formal properties that capture all necessary design details. The approach has been applied to several industry-level designs, demonstrating its practicality and effectiveness. Experimental results show that the proposed approach significantly reduces the manual effort required for design verification, while simultaneously identifying several complex bugs that would have otherwise been difficult to detect. Overall, the trace-based approach presented in this paper represents a promising step towards addressing the design and verification challenges posed by increasingly complex SoCs.
KW - Complete property set
KW - Formal verification
KW - Metamodelling
KW - Model-driven generation
UR - http://www.scopus.com/inward/record.url?scp=85184663966&partnerID=8YFLogxK
U2 - 10.1109/MCSoC60832.2023.00081
DO - 10.1109/MCSoC60832.2023.00081
M3 - Conference contribution
AN - SCOPUS:85184663966
T3 - Proceedings - 2023 16th IEEE International Symposium on Embedded Multicore/Many-Core Systems-on-Chip, MCSoC 2023
SP - 508
EP - 515
BT - Proceedings - 2023 16th IEEE International Symposium on Embedded Multicore/Many-Core Systems-on-Chip, MCSoC 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th IEEE International Symposium on Embedded Multicore/Many-Core Systems-on-Chip, MCSoC 2023
Y2 - 18 December 2023 through 21 December 2023
ER -