TY - JOUR
T1 - Modeling and simulation of organic photodetectors for low light intensity applications
AU - Popescu, Bogdan Vlad
AU - Popescu, Dan Horia
AU - Lugli, Paolo
AU - Locci, Simone
AU - Arca, Francesco
AU - Tedde, Sandro Francesco
AU - Sramek, Maria
AU - Hayden, Oliver
PY - 2013
Y1 - 2013
N2 - In this paper, we investigate the dynamic response of two different bulk heterojunction organic photodetectors over a large illumination and frequency range. To our knowledge, there is no similar study that includes the nW cm 2 regime. Photocurrent transient measurements reveal that the interlayer at the hole-extracting electrode is critical for the device performance under ultralow illumination. Furthermore, we observe a nonlinear cutoff frequency behavior over the illumination range, which we attribute to interface-related phenomena. We perform a detailed simulation study of the transient response for the measured samples. Making use of a drift diffusion model that also takes into account charge trapping and detrapping effects, both in bulk and at material interfaces, we are able to successfully reproduce the measured transients. Based on our simulations, we propose an explanation for this effect: it can be attributed to the interplay between the potential landscape seen by the charge carriers and to the presence of a large concentration of interface trap states, as well as of fixed interface charges. The importance of smart interface engineering as a key factor for device optimization is also highlighted.
AB - In this paper, we investigate the dynamic response of two different bulk heterojunction organic photodetectors over a large illumination and frequency range. To our knowledge, there is no similar study that includes the nW cm 2 regime. Photocurrent transient measurements reveal that the interlayer at the hole-extracting electrode is critical for the device performance under ultralow illumination. Furthermore, we observe a nonlinear cutoff frequency behavior over the illumination range, which we attribute to interface-related phenomena. We perform a detailed simulation study of the transient response for the measured samples. Making use of a drift diffusion model that also takes into account charge trapping and detrapping effects, both in bulk and at material interfaces, we are able to successfully reproduce the measured transients. Based on our simulations, we propose an explanation for this effect: it can be attributed to the interplay between the potential landscape seen by the charge carriers and to the presence of a large concentration of interface trap states, as well as of fixed interface charges. The importance of smart interface engineering as a key factor for device optimization is also highlighted.
KW - Cutoff frequency
KW - interface engineering
KW - organic
KW - photodetector bulk heterojunction
KW - simulation
KW - trap states
UR - http://www.scopus.com/inward/record.url?scp=84878146981&partnerID=8YFLogxK
U2 - 10.1109/TED.2013.2259239
DO - 10.1109/TED.2013.2259239
M3 - Article
AN - SCOPUS:84878146981
SN - 0018-9383
VL - 60
SP - 1975
EP - 1981
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
IS - 6
M1 - 6515596
ER -