Abstract
Model calculations performed for the metal deposition in the vicinity of the tip of scanning tunneling microscope (STM) showed that presence of STM tip reduced the mass transport toward the substrate. This effect is not limited to the area beneath the end but extends over a distance of several micrometers. The results proved that shielding effects occurred during the deposition of metal ions in the presence of an STM under limiting current conditions.
Originalsprache | Englisch |
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Seiten (von - bis) | 169-172 |
Seitenumfang | 4 |
Fachzeitschrift | Journal of Electroanalytical Chemistry |
Jahrgang | 440 |
Ausgabenummer | 1-2 |
DOIs | |
Publikationsstatus | Veröffentlicht - 1 Jan. 1997 |
Extern publiziert | Ja |