Abstract
We have performed model calculations for the deposition of metal ions in the vicinity of the tip of a scanning tunneling microscope. Our results show that near the tip mass transport towards the substrate is greatly reduced. These findings may explain shielding effects that have been observed experimentally.
Originalsprache | Englisch |
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Seiten (von - bis) | 169-172 |
Seitenumfang | 4 |
Fachzeitschrift | Journal of Electroanalytical Chemistry |
Jahrgang | 440 |
Ausgabenummer | 1-2 |
DOIs | |
Publikationsstatus | Veröffentlicht - 20 Dez. 1997 |
Extern publiziert | Ja |