Abstract
Magnetic profiles of FM/AF/FM trilayers (FM=ferromagnet, AF=antiferromagnet), as a function of AF thickness t have been investigated by bulk magnetization and polarized neutron reflectivity measurements. DC magnetization results show a t-dependence of the magnetization reversal. From the analysis of polarized neutron reflectivity in conjunction with the DC magnetization we conclude that the thickness dependence of magnetization reversal is a direct consequence of domain wall formation across NiO.
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 484-487 |
| Seitenumfang | 4 |
| Fachzeitschrift | Journal of Magnetism and Magnetic Materials |
| Jahrgang | 286 |
| Ausgabenummer | SPEC. ISS. |
| DOIs | |
| Publikationsstatus | Veröffentlicht - Feb. 2005 |