Abstract
The magnetization of a thin Fe film epitaxially grown on GaAs(001)-4 × 6 was studied at different depths from the metal/semiconductor interface using a single layer of Fe0.5Co0.5 as a marker layer through a double-wedge Fe film. By measuring the X-ray magnetic circular dichroism spectroscopy at the L2,3 of Co, the magnetic response of the film could be sensed at different distances from the interface. Data show a reduction of the magnetization at the interface though the existence of a magnetically "dead" layer is completely ruled out. Moreover, the magnetization was found to be reduced at the Fe film surface.
Originalsprache | Englisch |
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Seiten (von - bis) | 177-180 |
Seitenumfang | 4 |
Fachzeitschrift | Physica B: Condensed Matter |
Jahrgang | 345 |
Ausgabenummer | 1-4 |
DOIs | |
Publikationsstatus | Veröffentlicht - 1 März 2004 |
Extern publiziert | Ja |
Veranstaltung | Proceedings of the Conference on Polarised Neutron - Venice, Italien Dauer: 4 Aug. 2003 → 6 Aug. 2003 |