Low frequency noise considerations for CMOS analog circuit design

Ralf Brederlow, Jeongwook Koh, Gilson I. Wirth, Roberto Da Silva, Marc Tiebout, Roland Thewes

Publikation: Beitrag in Buch/Bericht/KonferenzbandKonferenzbeitragBegutachtung

6 Zitate (Scopus)

Abstract

This paper gives an overview on 1/f-noise issues relevant for today's CMOS analog circuit design. The device-to-circuit relation of noise and the relevant operating conditions are reviewed. Modeling of the biasing dependence of 1/f-noise amplitude including large signal and statistical effects are discussed. The noise corner frequency is shown to increase with CMOS technology scaling, and statistical effects are shown to even scale worse compared to the 1/f-noise. Moreover circuit design measures against noise are investigated. Finally, reliability issues concerning 1/f-noise in analog circuits are reviewed.

OriginalspracheEnglisch
TitelNOISE AND FLUCTUATIONS
Untertitel18th International Conference on Noise and Fluctuations - ICNF 2005
Seiten703-708
Seitenumfang6
DOIs
PublikationsstatusVeröffentlicht - 25 Aug. 2005
Extern publiziertJa
VeranstaltungNOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005 - Salamanca, Spanien
Dauer: 19 Sept. 200523 Sept. 2005

Publikationsreihe

NameAIP Conference Proceedings
Band780
ISSN (Print)0094-243X
ISSN (elektronisch)1551-7616

Konferenz

KonferenzNOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005
Land/GebietSpanien
OrtSalamanca
Zeitraum19/09/0523/09/05

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