TY - GEN
T1 - Learning temporal specifications from imperfect traces using Bayesian inference
AU - Mrowca, Artur
AU - Nocker, Martin
AU - Steinhorst, Sebastian
AU - Günnemann, Stephan
N1 - Publisher Copyright:
© 2019 Association for Computing Machinery.
PY - 2019/6/2
Y1 - 2019/6/2
N2 - Verification is essential to prevent malfunctioning of software systems. Model checking allows to verify conformity with nominal behavior. As manual definition of specifications from such systems gets infeasible, automated techniques to mine specifications from data become increasingly important. Existing approaches produce specifications of limited lengths, do not segregate functions and do not easily allow to include expert input. We present BaySpec, a dynamic mining approach to extract temporal specifications from Bayesian models, which represent behavioral patterns. This allows to learn specifications of arbitrary length from imperfect traces. Within this framework we introduce a novel extraction algorithm that for the first time mines LTL specifications from such models.
AB - Verification is essential to prevent malfunctioning of software systems. Model checking allows to verify conformity with nominal behavior. As manual definition of specifications from such systems gets infeasible, automated techniques to mine specifications from data become increasingly important. Existing approaches produce specifications of limited lengths, do not segregate functions and do not easily allow to include expert input. We present BaySpec, a dynamic mining approach to extract temporal specifications from Bayesian models, which represent behavioral patterns. This allows to learn specifications of arbitrary length from imperfect traces. Within this framework we introduce a novel extraction algorithm that for the first time mines LTL specifications from such models.
KW - Bayesian inference
KW - Data-driven verification
KW - Path merging
KW - Specification mining
UR - https://www.scopus.com/pages/publications/85067793479
U2 - 10.1145/3316781.3317847
DO - 10.1145/3316781.3317847
M3 - Conference contribution
AN - SCOPUS:85067793479
T3 - Proceedings - Design Automation Conference
BT - Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 56th Annual Design Automation Conference, DAC 2019
Y2 - 2 June 2019 through 6 June 2019
ER -